Advances Electronics Electron Physics Volume by Editor Marton (4 results)

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    • Published by Academic Press, New York, 1960

      • Hardcover
      • First Edition

      Seller: P.C. Schmidt, Bookseller, Kettering, OH, U.S.A.P.C. Schmidt, Bookseller

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      Condition: Used - Very good

      £ 7.63

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      Hard Cover. Condition: Very Good. First Edition. a very good hardcover; an ex-library copy with usual markings; internally pages bright and clean; ---------- SATISFACTION GUARANTEED --------- FAST, COURTEOUS SERVICE ------ ALL ORDERS SHIPPED WITH DELIVERY CONFIRMATION; Size: 6 x 9". Ex-Library.

    • Published by Academic Press, New York, 1973

      • Hardcover
      • First Edition

      Seller: P.C. Schmidt, Bookseller, Kettering, OH, U.S.A.P.C. Schmidt, Bookseller

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      Condition: Used - Very good

      £ 10.68

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      Hard Cover. Condition: Very Good. First Edition. a very good hardcover; an ex-library copy with usual markings; internally pages bright and clean; ---------- SATISFACTION GUARANTEED --------- FAST, COURTEOUS SERVICE ------ ALL ORDERS SHIPPED WITH DELIVERY CONFIRMATION; Size: 6 x 9". Ex-Library.

    • Language: English

      Published by Academic Press, 1966

      • Hardcover

      Seller: BookDepart, Shepherdstown, WV, U.S.A.BookDepart

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      Condition: Used - Good

      £ 26.81

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      Hardcover. Condition: UsedGood. Hardcover; surplus library copy with the usual stampings; reference number affixed to spine; fading and shelf wear to exterior; otherwise in good cond ition with clean text and tight binding.

    • Language: English

      Published by Academic Press New York 1977, 1977

      0120146436 / 9780120146437

      • Hardcover

      Seller: Peter White Books, Alton, United KingdomPeter White Books

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      £ 9.00

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      Hard Cover. Vg (no dj, clean black cloth with gilt titles on green panel on spine, Royal Aircraft Establishment library markings else contents no fault) octavo 259pp. Electron micrograph analysis by optical transforms; Recent advances in electron beam addressed memories; Electron beams as analytical tools in surface research - LEED and AES; X-ray image intensifiers.…