This series covers topics ranging from the particle optics of accelerators, mass spectrometers, electron- and ion-microscopes, and their components to theoretical and practical aspects of modern electronics. Also covered is digital image processing and pattern recognition, including the devices employed and the methods developed.
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Seller: Peter White Books, Alton, United Kingdom
Hard Cover. Vg (no dj, clean black cloth with gilt titles on green panel on spine, Royal Aircraft Establishment library markings else contents no fault) octavo 259pp. Electron micrograph analysis by optical transforms; Recent advances in electron beam addressed memories; Electron beams as analytical tools in surface research - LEED and AES; X-ray image intensifiers. Seller Inventory # 5850