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  • Jinlong Zhu

    Language: English

    Published by Springer Nature Singapore, 2026

    ISBN 10: 9819581451 ISBN 13: 9789819581450

    Seller: AHA-BUCH GmbH, Einbeck, Germany

    Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

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    £ 246.19

    £ 55.29 shipping
    Ships from Germany to U.S.A.

    Quantity: 2 available

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    Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book includes original, peer-reviewed research papers from the 16th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2025) and the 3rd International Conference of Optical Imaging and Measurement (ICOIM 2025), held in Wuhan, China on May 25 28, 2025. The topics covered include but are not limited to: Measurement and characterization for atomic-level manufacturing, micro and nanometrology, quantum sensing and instruments, metrology and instruments for integrated circuits, in-process and inline metrology, optical metrology and inspection, surface metrology, material characterization, machine learning and signal processing, intelligent instrument for automation, sensors and actuators, uncertainty, traceability and calibration, optical imaging, optical technology, application and precision measurement, optical measurement, photoelectric device, optoelectronics and communication, biomedical optics, and optical material.The papers showcased here share the latest findings on optical metrology, optical imaging, nanometrology, intelligent systems, and process control, making the book a valuable asset for researchers, engineers, and university students alike.

  • Jinlong Zhu

    Language: English

    Published by Springer Nature Singapore Jun 2026, 2026

    ISBN 10: 9819581451 ISBN 13: 9789819581450

    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany

    Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

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    £ 237.31

    £ 19.81 shipping
    Ships from Germany to U.S.A.

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    Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book includes original, peer-reviewed research papers from the 16th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2025) and the 3rd International Conference of Optical Imaging and Measurement (ICOIM 2025), held in Wuhan, China on May 25 28, 2025. The topics covered include but are not limited to: Measurement and characterization for atomic-level manufacturing, micro and nanometrology, quantum sensing and instruments, metrology and instruments for integrated circuits, in-process and inline metrology, optical metrology and inspection, surface metrology, material characterization, machine learning and signal processing, intelligent instrument for automation, sensors and actuators, uncertainty, traceability and calibration, optical imaging, optical technology, application and precision measurement, optical measurement, photoelectric device, optoelectronics and communication, biomedical optics, and optical material.The papers showcased here share the latest findings on optical metrology, optical imaging, nanometrology, intelligent systems, and process control, making the book a valuable asset for researchers, engineers, and university students alike. 433 pp. Englisch.