9789819630516 - Probability Models in Reliability Analysis (university Texts in the Mathematical Sciences) by Mukherjee, S. P.; Nanda, Asok K. (7 results)

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    • Language: English

      Published by Springer, 2026

      9819630517 / 9789819630516

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    • Language: English

      Published by Springer, 2026

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      Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book delves into the fundamental theoretical aspects of reliability analysis, focusing on various probabilistic models. These models are essential for representing random variations in underlying variables such as time-to-failure, the number o

    • Language: English

      Published by Springer, 2026

      9819630517 / 9789819630516

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      Taschenbuch. Condition: Neu. Probability Models in Reliability Analysis | S. P. Mukherjee (u. a.) | Taschenbuch | University Texts in the Mathematical Sciences | xviii | Englisch | 2026 | Springer | EAN 9789819630516 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartm

    • Language: English

      Published by Palgrave Macmillan Jun 2026, 2026

      9819630517 / 9789819630516

      • Softcover
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      Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book delves into the fundamental theoretical aspects of reliability analysis, focusing on various probabilistic models. These models are essential for representing random variations in underlying variables such as time-to-failu

    • Language: English

      Published by Springer, 2026

      9819630517 / 9789819630516

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    • Language: English

      Published by Springer, 2026

      9819630517 / 9789819630516

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    • Language: English

      Published by Palgrave Macmillan Jun 2026, 2026

      9819630517 / 9789819630516

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      Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book delves into the fundamental theoretical aspects of reliability analysis, focusing on various probabilistic models. These models are essential for representing random variations in underlying variables such as time-to-failure,