9783845432021 - Radiation Harden Devices and Circuits for Analog Application: Devices and Circuits for Analog and Rf Application Under Extreme Environment by Jain, Chandra Prakash (9 results)
- Softcover
Seller: California Books, Miami, FL, U.S.A.California Books
Contact seller4-star sellerCondition: New
£ 46.96
Free ShippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 39.71
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
Contact seller4-star sellerCondition: Used - As new
£ 89.00
£ 25.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Like New. Like New. book.
- Softcover
- Print on Demand
Seller: PBShop.store US, Wood Dale, IL, U.S.A.PBShop.store US
Contact seller5-star sellerCondition: New
£ 43.35
Free ShippingShips within U.S.A.Quantity: Over 20 available
PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
- Softcover
- Print on Demand
Seller: PBShop.store UK, Fairford, GLOS, United KingdomPBShop.store UK
Contact seller5-star sellerCondition: New
£ 41.56
£ 3.29 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
PAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Language: English
Published by LAP LAMBERT Academic Publishing Sep 2011, 2011
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
Contact seller5-star sellerCondition: New
£ 43.32
£ 19.74 shippingShips from Germany to U.S.A.Quantity: 2 available
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionizat…ion dose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library. 96 pp. Englisch.
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 36.29
£ 42.05 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Jain Chandra PrakashChandra Prakash Jain Obtained B.E, M.Tech and pursuing PhD in VLSI Design. He worked in Instrumentation Limited, Kota for 2 years. Presently he is Sr. Assistant Professor in Electron…ics department at Banasthali Un.
Language: English
Published by LAP LAMBERT Academic Publishing Sep 2011, 2011
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
Contact seller5-star sellerCondition: New
£ 43.32
£ 51.50 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionization…dose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 96 pp. Englisch.
- Softcover
- Print on Demand
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
£ 43.85
£ 52.20 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionization d…ose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library.
