9783662443613 - X-ray Absorption Spectroscopy of Semiconductors: 190 (springer Series in Optical Sciences, 190) (10 results)
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Language: English
Published by Heidelberg, Springer, 2015
Series: Book 175 of 235 - Springer Series in Optical Sciences
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Hardcover. Condition: Gut. Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-05847 9783662443613 Sprache: Englisch Gewicht in Gramm: 550.
Language: English
Published by Springer, 2014
Series: Book 175 of 235 - Springer Series in Optical Sciences
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X-Ray Absorption Spectroscopy of Semiconductors
Schnohr, Claudia S. (Edited by)/ Ridgway, Mark C. (Edited by)
Language: English
Published by Springer, 2014
Series: Book 175 of 235 - Springer Series in Optical Sciences
- Hardcover
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Hardcover. Condition: Brand New. 2015 edition. 361 pages. 9.25x6.25x1.00 inches. In Stock.
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Language: English
Published by Springer Berlin Heidelberg, 2014
Series: Book 175 of 235 - Springer Series in Optical Sciences
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they f…orm the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.
Language: English
Published by Springer, 2014
Series: Book 175 of 235 - Springer Series in Optical Sciences
- Hardcover
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Language: English
Published by Springer, 2014
Series: Book 175 of 235 - Springer Series in Optical Sciences
- Hardcover
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Condition: new. Questo è un articolo print on demand.
Language: English
Published by Springer, 2014
Series: Book 175 of 235 - Springer Series in Optical Sciences
- Hardcover
- Print on Demand
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Condition: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.
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Language: English
Published by Springer Berlin Heidelberg Nov 2014, 2014
Series: Book 175 of 235 - Springer Series in Optical Sciences
- Hardcover
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materi…als given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research. 380 pp. Englisch.
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Language: English
Published by Springer Berlin Heidelberg, 2014
Series: Book 175 of 235 - Springer Series in Optical Sciences
- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a complete survey of the current state of the art of X-ray absorption spectroscopy of semiconductorsProvides an overview of a wide range of semiconductor materialsDisplays comprehensive summaries to allow the re…ader to access the grow.
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Language: English
Published by Springer, Springer Nov 2014, 2014
Series: Book 175 of 235 - Springer Series in Optical Sciences
- Hardcover
- Print on Demand
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Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases.Semiconductors are arguably our most technologically-relevant group of materials g…iven they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society.The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials.Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 380 pp. Englisch.
