ISBN: 9783319089935 - Hot Carrier Degradation in Semiconductor Devices (15 results)

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  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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    Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ('become hot'), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.…

  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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  • Language: English

    Published by Springer Verlag, 2014

    3319089935 / 9783319089935

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    Hardcover. Condition: Brand New. 517 pages. 9.25x6.25x1.50 inches. In Stock.

  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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  • Published by Springer 978-3-319-08993-5, Cham

    3319089935 / 9783319089935

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    Seller: Burton Lysecki Books, ABAC/ILAB, Winnipeg, MB, CanadaBurton Lysecki Books, ABAC/ILAB

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    [978-3-319-08993-5] 2015. (Hardcover) Fine, no dust jacket. 517pp. Black & white and color illustrations, formulas, references. (Science, Science, Semiconductors).

  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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  • Language: English

    Published by Springer International Publishing, Springer Nature Switzerland Nov 2014, 2014

    3319089935 / 9783319089935

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    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ('become hot'), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance. 528 pp. Englisch.…

  • Language: English

    Published by Springer International Publishing, 2014

    3319089935 / 9783319089935

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    Seller: moluna, Greven, Germanymoluna

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    Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Describes the intricacies of hot carrier degradation in modern semiconductor technologiesCovers the entire hot carrier degradation phenomenon, including topics such as characterization, carrier transport, carrier-defect interaction, technological .…

  • Language: English

    Published by Springer, Palgrave Macmillan Nov 2014, 2014

    3319089935 / 9783319089935

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    Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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    Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today¿s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (¿become hot¿), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 528 pp. Englisch.…

  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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    Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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