9783319089935 - Hot Carrier Degradation in Semiconductor Devices (12 results)

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  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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    Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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    Seller: Books Puddle, New York, NY, U.S.A.Books Puddle

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  • Language: English

    Published by Springer Verlag, 2014

    3319089935 / 9783319089935

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    Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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    Hardcover. Condition: Brand New. 517 pages. 9.25x6.25x1.50 inches. In Stock.

  • Language: English

    Published by Springer International Publishing, Springer Nature Switzerland, 2014

    3319089935 / 9783319089935

    • Hardcover

    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within device

  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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    Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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    Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand

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  • Language: English

    Published by Springer International Publishing, Springer Nature Switzerland Nov 2014, 2014

    3319089935 / 9783319089935

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    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transpo

  • Language: English

    Published by Springer International Publishing, 2014

    3319089935 / 9783319089935

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    Seller: moluna, Greven, Germanymoluna

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    Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Describes the intricacies of hot carrier degradation in modern semiconductor technologiesCovers the entire hot carrier degradation phenomenon, including topics such as characterization, carrier transport, ca

  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

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    Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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  • Language: English

    Published by Springer, Palgrave Macmillan Nov 2014, 2014

    3319089935 / 9783319089935

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    Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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    Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today¿s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport w

  • Language: English

    Published by Springer, 2014

    3319089935 / 9783319089935

    • Hardcover
    • Print on Demand

    Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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