9781441922090 - Scanning Microscopy for Nanotechnology: Techniques and Applications (8 results)

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  • Language: English

    Published by Springer, 2010

    1441922091 / 9781441922090

    • Softcover

    Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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  • Language: English

    Published by Springer New York, Springer US, 2010

    1441922091 / 9781441922090

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    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the r

  • Language: English

    Published by Springer New York Okt 2010, 2010

    1441922091 / 9781441922090

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    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of m

  • Language: English

    Published by Springer, 2010

    1441922091 / 9781441922090

    • Softcover
    • Print on Demand

    Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International

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    Condition: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.

  • Language: English

    Published by Springer, 2010

    1441922091 / 9781441922090

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    Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand

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  • Language: English

    Published by Springer New York, 2010

    1441922091 / 9781441922090

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents SEM fundamentals and applications for nanotechnologyIncludes integrated fabrication techniques using the SEM, such as e-beam and FIBCovers in-situ nanomanipulation of materialsWritten by international experts

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    Language: English

    Published by Springer, 2010

    1441922091 / 9781441922090

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    Seller: preigu, Osnabrück, Germanypreigu

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    Taschenbuch. Condition: Neu. Scanning Microscopy for Nanotechnology | Techniques and Applications | Weilie Zhou (u. a.) | Taschenbuch | xiv | Englisch | 2010 | Springer | EAN 9781441922090 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | An

  • Language: English

    Published by Springer, Springer Okt 2010, 2010

    1441922091 / 9781441922090

    • Softcover
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    Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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    Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low kV Scanning Electron Microscopy.- E-beam Nanolithography Integrated wit