Language: English
Published by Cambridge University Press, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
Seller: Prior Books Ltd, Cheltenham, United Kingdom
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Language: English
Published by Cambridge University Press, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
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Language: English
Published by Cambridge University Press, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
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Language: English
Published by Cambridge University Press 2011-02-17, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
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Language: English
Published by Cambridge University Press, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Condition: New. An introduction to RHEED for beginners plus detailed experimental and theoretical treatments for experts. Num Pages: 366 pages, black & white illustrations. BIC Classification: PNRX; TGMT; TJFD5. Category: (UP) Postgraduate, Research & Scholarly. Dimension: 245 x 171 x 20. Weight in Grams: 578. . 2011. Reissue. paperback. . . . .
Language: English
Published by Cambridge University Press, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
Seller: Kennys Bookstore, Olney, MD, U.S.A.
Condition: New. An introduction to RHEED for beginners plus detailed experimental and theoretical treatments for experts. Num Pages: 366 pages, black & white illustrations. BIC Classification: PNRX; TGMT; TJFD5. Category: (UP) Postgraduate, Research & Scholarly. Dimension: 245 x 171 x 20. Weight in Grams: 578. . 2011. Reissue. paperback. . . . . Books ship from the US and Ireland.
Language: English
Published by Cambridge University Press, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
Seller: Mispah books, Redhill, SURRE, United Kingdom
Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Cambridge University Press, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
Seller: AHA-BUCH GmbH, Einbeck, Germany
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth.
Language: English
Published by Cambridge University Press, Cambridge, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.
Paperback. Condition: new. Paperback. Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth. Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Language: English
Published by Cambridge University Press, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
Seller: Revaluation Books, Exeter, United Kingdom
Paperback. Condition: Brand New. reissue edition. 353 pages. 9.50x6.75x1.00 inches. In Stock. This item is printed on demand.
Language: English
Published by Cambridge University Press, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
£ 68.71
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Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
Language: English
Published by Cambridge University Press, Cambridge, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
Seller: CitiRetail, Stevenage, United Kingdom
Paperback. Condition: new. Paperback. Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth. Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
Language: English
Published by Cambridge University Press, 2010
ISBN 10: 0521184029 ISBN 13: 9780521184021
Seller: moluna, Greven, Germany
Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction t.
Language: English
Published by Cambridge University Press, Cambridge, 2011
ISBN 10: 0521184029 ISBN 13: 9780521184021
Seller: AussieBookSeller, Truganina, VIC, Australia
Paperback. Condition: new. Paperback. Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth. Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.