9780387400921 - High-resolution X-ray Scattering: from Thin Films to Lateral Nanostructures (advanced Texts in Physics) by Pietsch, Ullrich; Holy, Vaclav; Baumbach, Tilo (5 results)
- Hardcover
Seller: Antiquariat Bookfarm, Löbnitz, GermanyAntiquariat Bookfarm
Contact seller5-star sellerCondition: Used
£ 28.04
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Hardcover. 2nd ed. XVI, 408 Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-05638 9780387400921 Sprache: Englisch Gewicht in Gramm: 550.
- Hardcover
Seller: SpringBooks, Berlin, , GermanySpringBooks
Contact seller4-star sellerCondition: Used
£ 37.71
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Hardcover. Condition: Very Good. 2. Auflage. Unread, some shelfwear. Immediately dispatched from Germany.
- Hardcover
Seller: Buchpark, Trebbin, , GermanyBuchpark
Contact seller5-star sellerCondition: Used - Fine
£ 28.51
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 408 | Sprache: Englisch | Produktart: Bücher | During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magne…tic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Hardcover. Condition: Like New. Like New. book.
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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£ 146.68
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Condition: As New. Unread book in perfect condition.
