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Published by VDM Verlag 2009-03-20, 2009
ISBN 10: 3639129067 ISBN 13: 9783639129069
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Published by VDM Verlag Dr. Müller, 2009
ISBN 10: 3639129067 ISBN 13: 9783639129069
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Taschenbuch. Condition: Neu. Diffusion Reactions at Metal Oxide Interfaces | The Effect of an Applied Electric Field | Yeonseop Yu | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2009 | VDM Verlag Dr. Müller | EAN 9783639129069 | Verantwortliche Person für die EU: OmniScriptum GmbH & Co. KG, Bahnhofstr. 28, 66111 Saarbrücken, info[at]akademikerverlag[dot]de | Anbieter: preigu.
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Language: English
Published by VDM Verlag Dr. Müller, 2009
ISBN 10: 3639129067 ISBN 13: 9783639129069
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Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Yu YeonseopYeonseop Yu received his PhD degree in materialsnscience & engineering from Case Western Reserve University inn2005. Under the guidance of Prof. Frank Ernst, he studied thenion-exchange reaction of metal-oxide interfaces. .
Language: English
Published by VDM Verlag Dr. Müller, 2009
ISBN 10: 3639129067 ISBN 13: 9783639129069
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Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book describes experiments that have beencarried out on a model metal oxide interface tounderstand diffusion reactions and the effect of anexternal electric field across the interface. Theauthor has focused on investigating the formation ofa reaction phase, morphological changes, andredistribution of ions at the interface. Itdemonstrates that the morphology, the spatialdistribution of ions, and consequently, themetal oxide bonding can be substantially modified byannealing at elevated temperatures, and that theeffect of annealing can be strongly enhanced orhindered by applying an electric field. Sincemetal oxide adhesion and the fracture energysensitively depend on the spatial distributionof atomic species and the interface morphology, theresults presented in this book suggest thatannealing - in particular under applied electricfields - can have profound effects on thetechnologically important properties of metal oxideinterfaces.