Tsertov (25 results)

Condition: New. pp. 233.

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, held in Tallinn, Estonia, in September 2016. The 11 papers included in the book were carefully reviewed and selected from the 36 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design.…

Condition: New. pp. 240.

Paperback. Condition: Brand New. rep rev edition. 248 pages. 9.25x6.10x0.56 inches. In Stock.

Condition: New.

Condition: New.

Taschenbuch. Condition: Neu. VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability | 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers | Thomas Hollstein (u. a.) | Taschenbuch | IFIP Advances in Information and Communication Technology | xiv | Englisch | 2018 | Springer | EAN 9783319883793 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Paperback. Condition: Brand New. 180 pages. 8.66x5.91x0.41 inches. In Stock.

Hardcover. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condition: new. Questo è un articolo print on demand.

Condition: new. Questo è un articolo print on demand.

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, held in Tallinn, Estonia, in September 2016. The 11 papers included in the book were carefully reviewed and selected from the 36 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design. 248 pp. Englisch. …

Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, held in Tallinn, Estonia, in September 2016. The 11 papers included in the book were carefully reviewed and selected from the 36 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design. 248 pp. Englisch.…

Condition: New. Print on Demand pp. 233.

Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, held in Tallinn, Estonia, in September 2016. The 11 papers included in the book were carefully reviewed and selected from the 36 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design.…

Condition: New. PRINT ON DEMAND pp. 233.

Condition: New. Print on Demand pp. 240.

Condition: New. PRINT ON DEMAND pp. 240.

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Ubar RaimundRaimund Ubar, PhD: professor at Tallinn University of Technology, Estonia. Fields of Study: computer science, design for testability, fault diagnosis in digital systems. Lectured in 20+ universities, participated in 10+ E.…

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware 180 pp. Englisch.

Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, held in Tallinn, Estonia, in September 2016.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 248 pp. Englisch. …

Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, held in Tallinn, Estonia, in September 2016.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 248 pp. Englisch.…

Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Software-Based Self-Test (SBST) has been researched extensively in industry and academia for more than three decades, yet automated self-test generation still lacks a suitable formal framework for modeling microprocessors. This book presents a methodology for formalizing and automating SBST synthesis, offering a new approach to microprocessor modeling and test generation.The book comprises four interconnected parts, covering the state of the art in SBST, modeling methods, microprocessor model synthesis, high-level fault modeling, test-data generation, and self-test program construction. It then develops methods for automating model and self-test program synthesis and concludes by integrating SBST programs into the testing flow of processor-centric boards.Designed for CAD and test engineers, researchers, and graduate students, the book also provides supplementary material for courses in computer architecture, digital-system testing, and design for testability.…

Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Software-Based Self-Test (SBST) has been researched extensively in industry and academia for more than three decades, yet automated self-test generation still lacks a suitable formal framework for modeling microprocessors. This book presents a methodology for formalizing and automating SBST synthesis, offering a new approach to microprocessor modeling and test generation.The book comprises four interconnected parts, covering the state of the art in SBST, modeling methods, microprocessor model synthesis, high-level fault modeling, test-data generation, and self-test program construction. It then develops methods for automating model and self-test program synthesis and concludes by integrating SBST programs into the testing flow of processor-centric boards.Designed for CAD and test engineers, researchers, and graduate students, the book also provides supplementary material for courses in computer architecture, digital-system testing, and design for testability.OmniScriptum SRL, Str. Armeneasca 28/1, office 1, 2012 Chisinau 180 pp. Englisch.…