Shin Youngsoo Editor (1 results)
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VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers (IFIP Advances in Information and Communication Technology)
Shin, Youngsoo (Editor) / Tsui, Chi Ying (Editor) / Kim, Jae-Joon (Editor) / Choi, Kiyoung (Editor) / Reis, Ricardo (Editor)
Language: English
Published by Springer, 2018
Series: Book 143 of 292 - IFIP Advances in Information and Communication Technology
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
£ 71.30
£ 10.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Brand New. rep rev edition. 240 pages. 9.25x6.10x0.63 inches. In Stock.
