Rauch Iii Stewart E (4 results)
Reliability Wearout Mechanisms In Advanced Cmos Technologies
Strong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Sune, Jordi; La Rosa, Giuseppe; Sullivan, Timothy D.; Rauch III, Stewart E.
- Hardcover
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
Contact seller5-star sellerCondition: New
£ 117.56
Free ShippingShips within U.S.A.Quantity: 5 available
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Reliability Wearout Mechanisms In Advanced Cmos Technologies
Strong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Sune, Jordi; La Rosa, Giuseppe; Sullivan, Timothy D.; Rauch III, Stewart E.
- Hardcover
Seller: SMASS Sellers, IRVING, TX, U.S.A.SMASS Sellers
Contact seller4-star sellerCondition: New
£ 121.67
Free ShippingShips within U.S.A.Quantity: 5 available
Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
- Hardcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
Contact seller5-star sellerCondition: New
£ 172.58
£ 9.99 shippingShips from United Kingdom to U.S.A.Quantity: 20 available
Hardcover. Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 3-4 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.
Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
Strong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Sune, Jordi; La Rosa, Giuseppe; Sullivan, Timothy D.; Rauch III, Stewart E.
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 187.88
£ 14.94 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In English.
