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Taschenbuch. Condition: Neu. Optical Characterization of Thin Solid Films | Olaf Stenzel (u. a.) | Taschenbuch | xxiv | Englisch | 2018 | Springer | EAN 9783030092009 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Introduction to Thin Film Spectroscopy Physics (2nd Edition)(Chinese Edition)
Language: Chinese
Published by National Defense Industry Press
ISBN 10: 711812320X ISBN 13: 9787118123203
Hardcover. Condition: New. HardCover. Pub Date: 2021-06-01 Pages: 288 Language: Chinese Publisher: National Defense Industry Press Introduction to Thin Film Spectroscopy Physics (Second Edition) contains the main physical issues in solid thin film spectroscopy. and summarizes the dispersion in the spectrum A large number of facts and results in papers and textbooks such as science. optics. nonlinear optics. electrodynamics. solid state physics and theoretical physics. discussed the basic characteristics of thin film sp.
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Optical characterization of solid thin films(Chinese Edition)
Language: Chinese
Published by National Defense Industry Press, 2021
ISBN 10: 711812317X ISBN 13: 9787118123173
Hardcover. Condition: New. HardCover. Pub Date: 2021-07-01 Pages: 393 Language: Chinese Publisher: National Defense Industry Press Optical Characterization of Solid Films introduces a variety of optical film characterization techniques. readers can quickly understand the technical level of optical film characterization and New development direction.?For the specific solid thin film testing technology. not only the basic principles are introduced. but also the typical examples are combined to illustrate. which has a ver.
