Martin Schidbauer (1 results)
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Language: English
Published by Springer, New York, 2004
- Hardcover
Seller: Edmonton Book Store, Edmonton, AB, CanadaEdmonton Book Store
Contact seller4-star sellerCondition: Used - Very good
£ 96.06
£ 42.53 shippingShips from Canada to U.S.A.Quantity: 1 available
Condition: Very Good. Dust Jacket Condition: No dustjacket, as published. 8vo pp. 214, as new, still in shrink wrap. "This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems. book.…