Joseph Pomager (23 results)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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£ 26.89
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- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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£ 27.89
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- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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£ 18.48
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- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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£ 20.74
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Condition: As New. Unread book in perfect condition.
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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£ 28.61
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- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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£ 33.14
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Condition: As New. Unread book in perfect condition.
- Softcover
- Print on Demand
Seller: PBShop.store US, Wood Dale, IL, U.S.A.PBShop.store US
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£ 16.44
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PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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£ 24.42
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Taschenbuch. Condition: Neu. Neuware.
- Softcover
- Print on Demand
Seller: PBShop.store UK, Fairford, GLOS, United KingdomPBShop.store UK
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£ 15.30
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PAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
£ 39.57
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Buch. Condition: Neu. Neuware - The high cost of failure for microelectronic devices operating in the space environment has led to a need for an accurate characterization of a device's reliability prior to being deployed. In addition, significant cost savings can be achieved by determining this reliability prior to fabrication.…High performance and flexibility requirements for many space applications have led to an integration of small feature-sized field programmable gate arrays (FPGA) into system designs. Specifically, feature sizes as small as 130, 90, and 65 nm. In this research, a characterization of the space environment is constructed specifically to address the typical conditions that can affect the performance and functionality of small feature-sized FPGAs, centered on temperature, non-ideal supply voltage, and radiation effects. A simulation technique is developed to determine the reliability of a microelectronic device prior to fabrication and deployment into the space environment. The technique is based on identifying the key elements of a circuit, simulating these key elements under each characterized condition individually, and then a comprehensive simulation of the elements under all enumerated combinations of the characterized conditions at the transistor-level using the HSPICE device simulation tool. Reliability calculations are performed based on simulation results and identified critical performance criteria. A demonstration of the technique is accomplished showing the poor reliability of non-radiation hardened small feature-sized commercial-off-the-shelf (COTS) FPGAs in four common satellite orbits around the earth. The results are then compared to an established, radiation hardened FPGA.
- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
Contact seller4-star sellerCondition: Used - As new
£ 112.00
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, , United KingdomMajestic Books
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£ 19.63
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Condition: New. Print on Demand.
- Softcover
- Print on Demand
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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£ 23.86
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- Hardcover
- Print on Demand
Seller: PBShop.store US, Wood Dale, IL, U.S.A.PBShop.store US
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£ 28.94
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HRD. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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£ 20.09
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- Hardcover
- Print on Demand
Seller: PBShop.store UK, Fairford, GLOS, United KingdomPBShop.store UK
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£ 26.27
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HRD. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
- Hardcover
- Print on Demand
Seller: Majestic Books, Hounslow, , United KingdomMajestic Books
Contact seller4-star sellerCondition: New
£ 31.35
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Condition: New. Print on Demand.
- Hardcover
- Print on Demand
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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£ 36.50
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Condition: New. Print on Demand.
- Hardcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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£ 32.71
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Condition: New. PRINT ON DEMAND.
- Softcover
- Print on Demand
Seller: CitiRetail, Stevenage, United KingdomCitiRetail
Contact seller5-star sellerCondition: New
£ 18.49
£ 37.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: new. Paperback. The high cost of failure for microelectronic devices operating in the space environment has led to a need for an accurate characterization of a device's reliability prior to being deployed. In addition, significant cost savings can be achieved by determining this reliability prior to fabrica…tion. High performance and flexibility requirements for many space applications have led to an integration of small feature-sized field programmable gate arrays (FPGA) into system designs. Specifically, feature sizes as small as 130, 90, and 65 nm. In this research, a characterization of the space environment is constructed specifically to address the typical conditions that can affect the performance and functionality of small feature-sized FPGAs, centered on temperature, non-ideal supply voltage, and radiation effects. A simulation technique is developed to determine the reliability of a microelectronic device prior to fabrication and deployment into the space environment. The technique is based on identifying the key elements of a circuit, simulating these key elements under each characterized condition individually, and then a comprehensive simulation of the elements under all enumerated combinations of the characterized conditions at the transistor-level using the HSPICE device simulation tool. Reliability calculations are performed based on simulation results and identified critical performance criteria. A demonstration of the technique is accomplished showing the poor reliability of non-radiation hardened small feature-sized commercial-off-the-shelf (COTS) FPGAs in four common satellite orbits around the earth. The results are then compared to an established, radiation hardened FPGA.This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work.This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
- Hardcover
- Print on Demand
Seller: CitiRetail, Stevenage, United KingdomCitiRetail
Contact seller5-star sellerCondition: New
£ 29.49
£ 37.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Hardcover. Condition: new. Hardcover. The high cost of failure for microelectronic devices operating in the space environment has led to a need for an accurate characterization of a device's reliability prior to being deployed. In addition, significant cost savings can be achieved by determining this reliability prior to fabrica…tion. High performance and flexibility requirements for many space applications have led to an integration of small feature-sized field programmable gate arrays (FPGA) into system designs. Specifically, feature sizes as small as 130, 90, and 65 nm. In this research, a characterization of the space environment is constructed specifically to address the typical conditions that can affect the performance and functionality of small feature-sized FPGAs, centered on temperature, non-ideal supply voltage, and radiation effects. A simulation technique is developed to determine the reliability of a microelectronic device prior to fabrication and deployment into the space environment. The technique is based on identifying the key elements of a circuit, simulating these key elements under each characterized condition individually, and then a comprehensive simulation of the elements under all enumerated combinations of the characterized conditions at the transistor-level using the HSPICE device simulation tool. Reliability calculations are performed based on simulation results and identified critical performance criteria. A demonstration of the technique is accomplished showing the poor reliability of non-radiation hardened small feature-sized commercial-off-the-shelf (COTS) FPGAs in four common satellite orbits around the earth. The results are then compared to an established, radiation hardened FPGA.This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work.This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
