Dutta Hema (8 results)

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Paperback. Condition: Brand New. 43 pages. 9.00x6.00x0.25 inches. In Stock.

Taschenbuch. Condition: Neu. Microstructure characterization of some polycrystalline materials | Preparation and microstructure characterization of some industrial polycrystalline materials by Rietveld method | Hema Dutta (u. a.) | Taschenbuch | 260 S. | Englisch | 2010 | LAP LAMBERT Academic Publishing | EAN 9783838397764 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu.

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides detailed analytical formulation for active cancellation of probing in conformal phased arrayIncludes several colored illustrations for proving the efficiency of algorithmProvides a step-by-step approach for analyzing probe suppress.

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In this book the results of preparation and microstructure characterization of some of the polycrystalline industrial materials are reported. It is well established that 'tailor made' materials with desired properties can be obtained by controlling the defect related microstructure parameters. The microstructure of a material can be characterized from an analysis of X-ray diffraction line profile that provides a nondestructive indirect method for obtaining large number of microstructure parameters. Polycrystalline materials have been prepared by vacuum melting and high energy ball milling methods. Microstructure characterization of the prepared materials has been made using X-ray powder diffraction, high- resolution optical microscopy and transmission electron microscopy etc. Mechanical property of some of the metallic alloys in terms of microhardness has been measured and structure property correlation has been established for these materials. Special emphasis has been given to the modified Warren-Averbach's approach of Fourier analysis and Rietveld's method of whole powder diffraction profile fitting analysis. 260 pp. Englisch.

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Dutta Dr. HemaDr. Hema Dutta is presently working as Assistant Professor in Physics. She worked on preparation and microstructure characterization of nanocrystalline material and obtained Ph.D degree from The University of Burdwan. S.

Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -In this book the results of preparation and microstructure characterization of some of the polycrystalline industrial materials are reported. It is well established that 'tailor made' materials with desired properties can be obtained by controlling the defect related microstructure parameters. The microstructure of a material can be characterized from an analysis of X-ray diffraction line profile that provides a nondestructive indirect method for obtaining large number of microstructure parameters. Polycrystalline materials have been prepared by vacuum melting and high energy ball milling methods. Microstructure characterization of the prepared materials has been made using X-ray powder diffraction, high- resolution optical microscopy and transmission electron microscopy etc. Mechanical property of some of the metallic alloys in terms of microhardness has been measured and structure property correlation has been established for these materials. Special emphasis has been given to the modified Warren-Averbach''s approach of Fourier analysis and Rietveld''s method of whole powder diffraction profile fitting analysis.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 260 pp. Englisch.

Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - In this book the results of preparation and microstructure characterization of some of the polycrystalline industrial materials are reported. It is well established that 'tailor made' materials with desired properties can be obtained by controlling the defect related microstructure parameters. The microstructure of a material can be characterized from an analysis of X-ray diffraction line profile that provides a nondestructive indirect method for obtaining large number of microstructure parameters. Polycrystalline materials have been prepared by vacuum melting and high energy ball milling methods. Microstructure characterization of the prepared materials has been made using X-ray powder diffraction, high- resolution optical microscopy and transmission electron microscopy etc. Mechanical property of some of the metallic alloys in terms of microhardness has been measured and structure property correlation has been established for these materials. Special emphasis has been given to the modified Warren-Averbach's approach of Fourier analysis and Rietveld's method of whole powder diffraction profile fitting analysis.