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Amith Singhee (38 results)
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Condition: very_good. Book has little sign of wear or use.
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Condition: New. pp. 212.
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Condition: New. pp. 212 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering, 46)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 94.30
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New. pp. 212.
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Condition: New. pp. 212.
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. This book presents novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. It draws on theories from a wide variety of scientific fields and applies them to parallel problems in numerous other fields. Series: Lecture Notes in Electrical Engineering. Num Pages: 210 pages, biography. BIC Classification: TJFC; UYD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 305. . 2012. Paperback. . . . .
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. This book presents novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. It draws on theories from a wide variety of scientific fields and applies them to parallel problems in numerous other fields. Series: Lecture Notes in Electrical Engineering. Num Pages: 210 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 12. Weight in Grams: 1050. . 2009. Hardback. . . . .
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Paperback. Condition: Brand New. 2009 edition. 210 pages. 9.25x6.10x0.48 inches. In Stock.
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Condition: New. This book presents novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. It draws on theories from a wide variety of scientific fields and applies them to parallel problems in numerous other fields. Series: Lecture Notes in Electrical Engineering. Num Pages: 210 pages, biography. BIC Classification: TJFC; UYD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 305. . 2012. Paperback. . . . . Books ship from the US and Ireland.
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering, 46)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 134.30
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Extreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems)
Book 24 of 34: Integrated Circuits and SystemsSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 134.30
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New. This book presents novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. It draws on theories from a wide variety of scientific fields and applies them to parallel problems in numerous other fields. Series: Lecture Notes in Electrical Engineering. Num Pages: 210 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 12. Weight in Grams: 1050. . 2009. Hardback. . . . . Books ship from the US and Ireland.
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£ 76.07 10% off
£ 68.47
£ 91.59 shipping
Ships from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Paperback. Condition: Like New. Like New. book.
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Condition: New. pp. 258.
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Extreme Statistics in Nanoscale Memory Design
Book 24 of 34: Integrated Circuits and SystemsSeller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. 2012. Paperback. . . . . .
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Extreme Statistics in Nanoscale Memory Design
Book 24 of 34: Integrated Circuits and SystemsLanguage: English
Published by Springer-Verlag New York Inc., 2010
ISBN 10: 1441966056 ISBN 13: 9781441966056
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. This comprehensive book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations. It further provides solutions recently proposed in the Electronic Design Automation (EDA) community. Editor(s): Singhee, Amith; Rutenbar, Rob A. Series: Integrated Circuits and Systems. Num Pages: 246 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 15. Weight in Grams: 1190. . 2010. Hardback. . . . .
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Extreme Statistics in Nanoscale Memory Design
Book 24 of 34: Integrated Circuits and SystemsLanguage: English
Published by Springer US, Springer US, 2012
ISBN 10: 1461426723 ISBN 13: 9781461426721
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Knowledge exists: you only have to nd it VLSI design has come to an important in ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5-6s (0.
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Knowledge exists: you only have to nd it VLSI design has come to an important in ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5-6s (0.
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Condition: New. 2012. Paperback. . . . . . Books ship from the US and Ireland.
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Paperback. Condition: Like New. Like New. book.
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Extreme Statistics in Nanoscale Memory Design
Book 24 of 34: Integrated Circuits and SystemsLanguage: English
Published by Springer-Verlag New York Inc., 2010
ISBN 10: 1441966056 ISBN 13: 9781441966056
Condition: New. This comprehensive book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations. It further provides solutions recently proposed in the Electronic Design Automation (EDA) community. Editor(s): Singhee, Amith; Rutenbar, Rob A. Series: Integrated Circuits and Systems. Num Pages: 246 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 15. Weight in Grams: 1190. . 2010. Hardback. . . . . Books ship from the US and Ireland.
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Language: English
Published by Springer Netherlands, 2012
ISBN 10: 9400736878 ISBN 13: 9789400736870
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applicationsApplies theory from a wide variety of scientific fields (machine learning, computational finance, number theory, actuarial.
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Language: English
Published by Springer Netherlands, 2009
ISBN 10: 9048130999 ISBN 13: 9789048130993
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applicationsApplies theory from a wide variety of scientific fields (machine learning, computational finance, number theory, actuarial.
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Condition: New. Print on Demand pp. 212 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Condition: New. PRINT ON DEMAND pp. 212.
