Tutorial: Test Generation for Vlsi Chips

ISBN 10: 081868786X / ISBN 13: 9780818687860

Published by IEEE Computer Society, 1988

About this Item

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Bibliographic Details

Title: Tutorial: Test Generation for Vlsi Chips

Publisher: IEEE Computer Society

Publication Date: 1988

Binding: Hardcover

Condition: New

About this title

Synopsis:

Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pages. Topics include fault modeling, test generation, test evaluation, testability analysis, design for testability, and automatic test equipment. Annotation copyright Book News, Inc. Portland, Or.

Synopsis:

Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pag