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Synopsis
Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pages. Topics include fault modeling, test generation, test evaluation, testability analysis, design for testability, and automatic test equipment. Annotation copyright Book News, Inc. Portland, Or.
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Synopsis
Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pag
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- PublisherIEEE Computer Society Press,U.S.
- Publication date1988
- ISBN 10 081868786X
- ISBN 13 9780818687860
- BindingHardcover
- LanguageEnglish
- Number of pages400
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Tutorial: Test Generation for Vlsi Chips
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IEEE Computer Society Press,U.S., 1988
ISBN 10: 081868786X
ISBN 13: 9780818687860
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Condition: Sehr gut. Zustand: Sehr gut - Gepflegter, sauberer Zustand. Außen: verschmutzt. Innen: Seiten eingerissen. Aus der Auflösung einer renommierten Bibliothek. Kann Stempel beinhalten. | Seiten: 400 | Sprache: Englisch | Produktart: Sonstiges. Seller Inventory # 42682699/202
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Tutorial: Test Generation for Vlsi Chips
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Hardcover. Condition: Bon. Ancien livre de bibliothèque. Petite(s) trace(s) de pliure sur la couverture. Légères traces d'usure sur la couverture. Salissures sur la tranche. Couverture différente. Edition 1988. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisat ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Slightly creased cover. Slight signs of wear on the cover. Stains on the edge. Different cover. Edition 1988. Ammareal gives back up to 15% of this item's net price to charity organizations. Seller Inventory # E-812-693
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Test Generation for VLSI Chips
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Tutorial: Test Generation for Vlsi Chips
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Tutorial: Test Generation for Vlsi Chips
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