System-on-Chip Test Architectures: Nanometer Design for Testability (Volume .) (Systems on Silicon, Volume .)

Wang, Laung-Terng; Stroud, Charles E.; Touba, Nur A.

ISBN 10: 012373973X ISBN 13: 9780123739735
Published by Morgan Kaufmann, 2007
Language: English
Condition: Used - Good Hardcover

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Used - Hardcover

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