Software Defect and Operational Profile Modeling

Language: English

Published by Springer US, 1998

0792382595 / 9780792382591

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also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 Preface. 1. Introduction. 2. Empirical Regression Methods. 3. Dynamic Methods. 4. Capture-Recapture Methods. 5. Decomposition Me.

Seller Inventory # 5970784

Title
Software Defect and Operational Profile Modeling
Author
Kai-Yuan Cai
Publisher
Springer US
Publication year
1998
Condition
New
Binding
Gebunden
Language
English
ISBN 10
0792382595
ISBN 13
9780792382591

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

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