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Software Defect and Operational Profile Modeling: 4 (International Series in Software Engineering, 4) - Hardcover
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also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1
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Review
`This well-crafted summary of research and engineering in software defect estimation and operational profile modeling is a useful addition to the software reliability engineering literature.'
Computing Reviews (June 1999)
Synopsis
This title is also in: "The Kluwer International Series on Asian Studies in Computer and Information Science, Volume 1".
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 Preface. 1. Introduction. 2. Empirical Regression Methods. 3. Dynamic Methods. 4. Capture-Recapture Methods. 5. Decomposition Me. Seller Inventory # 5970784
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Software Defect and Operational Profile Modeling (International Series in Software Engineering, 4)
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Buch. Condition: Neu. Software Defect and Operational Profile Modeling | Kai-Yuan Cai | Buch | xix | Englisch | 1998 | Springer US | EAN 9780792382591 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Seller Inventory # 102549241
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Springer US, Springer New York Aug 1998, 1998
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Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 292 pp. Englisch. Seller Inventory # 9780792382591