SEMICONDUCTOR MEMORIES TECHNOLOGY TESTING AND RELIABILITY (HB 1997). This item is unavailable.
Language: English
Published by JOHN WILEY (ORIGINAL), 1997
- Hardcover
- New
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Condition: New
£ 289.06
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Seller Inventory # Cvs 9780780310001
- Title
- SEMICONDUCTOR MEMORIES TECHNOLOGY TESTING AND RELIABILITY (HB 1997)
- Author
- SHARMA
- Publisher
- JOHN WILEY (ORIGINAL)
- Publication year
- 1997
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0780310004
- ISBN 13
- 9780780310001
- Edition
- International Edition
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
"Synopsis" may belong to another edition of this title.
About the Author
ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability. He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.
"About the title" may belong to another edition of this title.