Proceedings: Fiftieth Annual Meeting, Electron Microscopy Society of America; Twenty-Seventh Annual Meeting, Microbeam Analysis Society; Nineteenth Annual Meeting, Microscopical Society of Canada/Societe de Microscopie du Canada. Boston, Massachusetts, 16-21 August 1992. Part II of the Proceedings. This item is unavailable.
Language: English
Published by San Francisco Press, San Francisco, CA., 1992
- Hardcover
- Used
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Seller: Tiber Books, Cockeysville, MD, U.S.A.Tiber Books
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Hardcover
Condition: Used - Very good
£ 23.76
Item description from seller
8vo, hardcover. PART II of the Proceedings, pp. 936-1789. No dj, maroon cloth. Vg+ condition. Upper spine very slightly bumped; contents bright, crisp & clean, unread.
Seller Inventory # 1121016.26
Bibliographic details
- Title
- Proceedings: Fiftieth Annual Meeting, Electron Microscopy Society of America; Twenty-Seventh Annual Meeting, Microbeam Analysis Society; Nineteenth Annual Meeting, Microscopical Society of Canada/Societe de Microscopie du Canada. Boston, Massachusetts, 16-21 August 1992. Part II of the Proceedings
- Author
- Bailey, G.W.; Bentley, J.; Small, J. A., eds.
- Publisher
- San Francisco Press, San Francisco, CA.
- Publication year
- 1992
- Condition
- Very Good
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 9991183248
- ISBN 13
- 9789991183244