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Proceedings: Fiftieth Annual Meeting, Electron Microscopy Society of America; Twenty-Seventh Annual Meeting, Microbeam Analysis Society; Nineteenth Annual Meeting, Microscopical Society of Canada/Societe de Microscopie du Canada. Boston, Massachusetts, 16-21 August 1992. Part II of the Proceedings
Bailey, G.W.; Bentley, J.; Small, J. A., eds.
Language: English
Published by San Francisco Press, San Francisco, CA., 1992
9991183248 / 9789991183244
- Hardcover
Seller: Tiber Books, Cockeysville, MD, U.S.A.Tiber Books
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Condition: Used - Very good
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Hardcover. Condition: Very Good. 8vo, hardcover. PART II of the Proceedings, pp. 936-1789. No dj, maroon cloth. Vg+ condition. Upper spine very slightly bumped; contents bright, crisp & clean, unread.