Optical Testing of Semiconductor Devices under High Energy Pulses

Language: English

Published by Südwestdeutscher Verlag Für Hochschulschriften Mär 2009, 2009

3838104048 / 9783838104041

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This item is printed on demand - Print on Demand Titel. Neuware -For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitoring of the refractive index, absorption or light emission have previously been developed for investigation of transient temperature or free carrier changes. However, these methods suffer either from small spatial or time resolution. Therefore two testing techniques based on transient interferometric mapping have been developed within this thesis: a two-dimensional multiple-time-instant single-shot technique and a two-beam technique with sub-nanosecond time resolution.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 160 pp. Deutsch.

Seller Inventory # 9783838104041

Title
Optical Testing of Semiconductor Devices under High Energy Pulses
Author
Viktor Dubec
Publisher
Südwestdeutscher Verlag Für Hochschulschriften Mär 2009
Publication year
2009
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
3838104048
ISBN 13
9783838104041
Item weight
256 grams
Dimensions
220x150x11 mm

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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