Optical Testing of Semiconductor Devices under High Energy Pulses: Advanced Optical Interferometric Methods for Nanosecond Mapping of Semiconductor Devices under High Energy Pulses - Softcover
Synopsis
For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitoring of the refractive index, absorption or light emission have previously been developed for investigation of transient temperature or free carrier changes. However, these methods suffer either from small spatial or time resolution. Therefore two testing techniques based on transient interferometric mapping have been developed within this thesis: a two-dimensional multiple-time-instant single-shot technique and a two-beam technique with sub-nanosecond time resolution.
"synopsis" may belong to another edition of this title.
About the Author
Viktor Dubec was born in 1977 in Bratislava, Slovakia. He received his Mag. degree in year 2000 at the Department of Optics and Optoelectronics, Comenius University Bratislava. In 2001 he joined the group for investigation of ESD protection devices at the Institute for Solid State Electronics, Vienna University of Technology, Austria.
"About this title" may belong to another edition of this title.
Search results for Optical Testing of Semiconductor Devices under High...
Seller Image
Optical Testing of Semiconductor Devices under High Energy Pulses
Published by
Südwestdeutscher Verlag Für Hochschulschriften AG Co. KG Jul 2015, 2015
ISBN 10: 3838104048
ISBN 13: 9783838104041
New
Taschenbuch
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitoring of the refractive index, absorption or light emission have previously been developed for investigation of transient temperature or free carrier changes. However, these methods suffer either from small spatial or time resolution. Therefore two testing techniques based on transient interferometric mapping have been developed within this thesis: a two-dimensional multiple-time-instant single-shot technique and a two-beam technique with sub-nanosecond time resolution. 160 pp. Deutsch. Seller Inventory # 9783838104041
Seller Image
Optical Testing of Semiconductor Devices under High Energy Pulses
Published by
Südwestdeutscher Verlag für Hochschulschriften, 2015
ISBN 10: 3838104048
ISBN 13: 9783838104041
New
Softcover
Seller: moluna, Greven, Germany
Seller rating 5 out of 5 stars
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitoring of the refractive index, absorption . Seller Inventory # 5404794
Buy New
£ 62.08
£ 42.24 shipping
Ships from Germany to U.S.A.
Ships from Germany to U.S.A.
Quantity: Over 20 available
Seller Image
Optical Testing of Semiconductor Devices under High Energy Pulses
Published by
Südwestdeutscher Verlag Für Hochschulschriften Mär 2009, 2009
ISBN 10: 3838104048
ISBN 13: 9783838104041
New
Taschenbuch
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitoring of the refractive index, absorption or light emission have previously been developed for investigation of transient temperature or free carrier changes. However, these methods suffer either from small spatial or time resolution. Therefore two testing techniques based on transient interferometric mapping have been developed within this thesis: a two-dimensional multiple-time-instant single-shot technique and a two-beam technique with sub-nanosecond time resolution.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 160 pp. Deutsch. Seller Inventory # 9783838104041
Seller Image
Optical Testing of Semiconductor Devices under High Energy Pulses : Advanced Optical Interferometric Methods for Nanosecond Mapping of Semiconductor Devices under High Energy Pulses
Published by
Südwestdeutscher Verlag Für Hochschulschriften AG Co. KG, 2009
ISBN 10: 3838104048
ISBN 13: 9783838104041
New
Taschenbuch
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - For optimisation of devices and verification of device simulation models the knowledge of heat dissipation and of free carrier concentration in the device is essential. Non-destructive optical methods based on monitoring of the refractive index, absorption or light emission have previously been developed for investigation of transient temperature or free carrier changes. However, these methods suffer either from small spatial or time resolution. Therefore two testing techniques based on transient interferometric mapping have been developed within this thesis: a two-dimensional multiple-time-instant single-shot technique and a two-beam technique with sub-nanosecond time resolution. Seller Inventory # 9783838104041
Seller Image
Optical Testing of Semiconductor Devices under High Energy Pulses | Advanced Optical Interferometric Methods for Nanosecond Mapping of Semiconductor Devices under High Energy Pulses
Published by
Südwestdeutscher Verlag für Hochschulschriften, 2015
ISBN 10: 3838104048
ISBN 13: 9783838104041
New
Taschenbuch
Seller: preigu, Osnabrück, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. Optical Testing of Semiconductor Devices under High Energy Pulses | Advanced Optical Interferometric Methods for Nanosecond Mapping of Semiconductor Devices under High Energy Pulses | Viktor Dubec | Taschenbuch | 160 S. | Deutsch | 2015 | Südwestdeutscher Verlag für Hochschulschriften | EAN 9783838104041 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Seller Inventory # 101644102