Paperback. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

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Bibliographic Details

Title: Materials Reliability in Microelectronics III: Volume 309 (Paperback)
Publisher: Cambridge University Press, Cambridge
Publication Date: 2014
Language: English
ISBN 10: 1107409489
ISBN 13: 9781107409484
Binding: Paperback
Condition: new

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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