Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 990 (Paperback)

Language: English

Published by Cambridge University Press, Cambridge, 2014

1107408717 / 9781107408715

  • Softcover
  • New
See all details

Seller: CitiRetail, Stevenage, United KingdomCitiRetail

5-star seller

AbeBooks seller since June 29, 2022

View this seller's items
Softcover

Condition: New

£ 37.49

£ 37.00 shipping 
Ships from United Kingdom to U.S.A.

Quantity: 1 available

Add to basket
Free 30-day returns

Item description from seller

Paperback. In 2004, the microelectronics industry quietly ushered in the Nanoelectronics Era with the mass production of sub-100nm node devices. The current leading-edge semiconductor chips in mass production - the so-called 90nm node devices - have a transistor gate length of less than 50nm. This rapid technological advancement in the semiconductor industry has been made possible by innovations in materials employed in both transistor fabrication (front-end-of-the-line, FEOL) and interconnect fabrication (back-end-of-the-line, BEOL). The 90nm node BEOL features copper (Cu) interconnects and dielectric materials with a low-dielectric constant (k) of about 3.0. However, for the next generations of 65nm node and beyond, evolutionary and revolutionary innovations in BEOL materials and processes are needed to fuel the continued, healthy growth of the semiconductor. This book provides a forum to exchange advances in materials, processes, integration, and reliability in advanced interconnects and packaging. The book also addresses interconnects for emerging technologies, including 3D chip stacking and optical interconnects, as well as interconnects for optoelectronics, plastic electronics and molecular electronics. This book provides a forum to exchange advances in materials, processes, integration, and reliability in advanced interconnects and packaging. The book also addresses interconnects for emerging technologies, including 3D chip stacking and optical interconnects, as well as interconnects for optoelectronics, plastic electronics and molecular electronics. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

Seller Inventory # 9781107408715

Title
Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 990 (Paperback)
Author
Qinghuang Lin
Publisher
Cambridge University Press, Cambridge
Publication year
2014
Condition
new
Binding
Paperback
Language
English
ISBN 10
1107408717
ISBN 13
9781107408715

CitiRetail

Stevenage, United Kingdom

5-star seller

AbeBooks seller since June 29, 2022

Shipping rates from United Kingdom to U.S.A.

Item7 to 14 business days7 to 60 business days
First item£ 37.00£ 37.00
Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.

Payment methods

  • Visa
  • Mastercard
  • American Express
  • Apple Pay
  • Google Pay

Store description

Online business

Seller's business information

ABC BOOKS LIMITED

10 John Street
London, United Kingdom WC1N 2EB