Local Pattern Detection : International Seminar Dagstuhl Castle, Germany, April 12-16, 2004, Revised Selected Papers

Morik, Katharina (EDT); Boulicaut, Jean-Francois (EDT); Siebes, Arno (EDT)

ISBN 10: 3540265430 ISBN 13: 9783540265436
Published by Springer, 2005
Language: English
Condition: New Soft cover

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