Interfacial Compatibility in Microelectronics : Moving Away from the Trial and Error Approach

Laurila, Tomi; Vuorinen, Vesa; Paulasto-kröckel, Mervi; Turunen, Markus; Mattila, Toni T.

ISBN 10: 1447160681 ISBN 13: 9781447160687
Published by Springer, 2014
Language: English
Condition: Used - As new Soft cover

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