High Resolution X-Ray Diffractometry And Topography

Language: English

Published by CRC Press, 2019

0367400634 / 9780367400637

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The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. Sprache: Englisch Gewicht in Gramm: 476.

Title
High Resolution X-Ray Diffractometry And Topography
Author
D. K. Bowen, Brian K. Tanner
Publisher
CRC Press
Publication year
2019
Condition
Neu
Binding
Softcover/Taschenbuch
Language
English
ISBN 10
0367400634
ISBN 13
9780367400637
Item weight
476 grams

Home-set

Mannheim, Germany

5-star seller

AbeBooks seller since April 13, 2026

Shipping rates from Germany to U.S.A.

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Home-set

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