Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling (Springer Series in Advanced Microelectronics, 52)

Book 50 of 72: Springer Series in Advanced Microelectronics
ISBN 10: 8132225074 ISBN 13: 9788132225072
Published by Springer, 2015
Language: English
Condition: New Hardcover

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