Failure Analysis of Integrated Circuits

Language: English

Published by Springer US, 1999

0412145618 / 9780412145612

Series: Book 195 of 260 - The Springer International Series in Engineering and Computer Science

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Seller: moluna, Greven, Germanymoluna

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa.

Seller Inventory # 5914199

Title
Failure Analysis of Integrated Circuits
Author
Wagner, Lawrence C.
Publisher
Springer US
Publication year
1999
Condition
New
Binding
Gebunden
Language
English
ISBN 10
0412145618
ISBN 13
9780412145612
Series
Book 195 of 260: The Springer International Series in Engineering and Computer Science

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

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