Development of Methods for Characterisation of Roughness in Three Dimensions (Ultra Precision Technology Series)

Liam Blunt Ken J. Stout

ISBN 10: 1857180232 ISBN 13: 9781857180237
Published by Elsevier Science & Technology, 2000
Language: English
Condition: New Soft cover

Sold by Versandbuchhandlung Kisch & Co., Fürstenberg OT Blumenow, Germany

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New - Soft cover

Condition: New

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