Development of Methods for Characterisation of Roughness in Three Dimensions (Ultra Precision Technology) - Softcover

Stout, Ken J; Blunt, Liam; Dong, W. P.; Mainsah, E.; Luo, N.; Mathia, T.; Sullivan, P. J.; Zahouani, H.

 
9781857180237: Development of Methods for Characterisation of Roughness in Three Dimensions (Ultra Precision Technology)
Softcover
ISBN 10: 1857180232 ISBN 13: 9781857180237
Publisher: Butterworth-Heinemann, 2002

Synopsis

Based on research funded by the European Commission, this important handbook provides a basis for a unified approach to three-dimensional surface finish assessment. It covers a broad range of issues related to 3-D micro-topography, with particular emphasis on standardisation, measurement, characterisation and interpretation. This reprint includes an updating introductory section. This work is to be the basis for a 3D international standard.

· Updated version of noted previous publication· Contains basis, for the first time, for a unified approach to the subject· The basis for a 3D international standard

"synopsis" may belong to another edition of this title.

About the Author

Professor Liam Blunt is Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK. He is author of numerous published papers and other contributions on surface technology, and is co-author with Ken Stout of Three Dimensional Surface Topography (published by Penton Press, 2000).

"About this title" may belong to another edition of this title.

Publisher
Butterworth-Heinemann
Publication date
2002
Language
English
ISBN 10 
1857180232
ISBN 13 
9781857180237
Binding
Paperback
Edition number
2
Number of pages
384