Development of Methods for Characterisation of Roughness in Three Dimensions (Ultra Precision Technology)

Ken J Stout, Liam Blunt, W. P. Dong, E. Mainsah, N. Luo, T. Mathia, P. J. Sullivan, H. Zahouani

ISBN 10: 1857180232 ISBN 13: 9781857180237
Published by Butterworth-Heinemann 2002-06-01, 2002
Language: English
Condition: New Soft cover

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