Design for AT-Speed Test, Diagnosis and Measurement

Language: English

Published by Springer US Sep 1999, 1999

0792386698 / 9780792386698

Series: Book 37 of 40 - Frontiers in Electronic Testing

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted. 260 pp. Englisch.…

Seller Inventory # 9780792386698

Title
Design for AT-Speed Test, Diagnosis and Measurement
Author
Benoit Nadeau-Dostie
Publisher
Springer US Sep 1999
Publication year
1999
Condition
Neu
Binding
Buch
Language
English
ISBN 10
0792386698
ISBN 13
9780792386698
Item weight
693 grams
Dimensions
260x183x19 mm
Series
Book 37 of 40: Frontiers in Electronic Testing

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
First item£ 19.26£ 19.26
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BuchWeltWeit Ludwig Meier e.K.

Germany