Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing, 15) - Hardcover
Book 37 of 40: Frontiers in Electronic Testing
Synopsis
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
"synopsis" may belong to another edition of this title.
Product Description
Design for AT-speed Test, Diagnosis and Measurement Offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. This book contains a complete design flow and analysis of the impact of embedded test on a design.
"About this title" may belong to another edition of this title.
Other Popular Editions of the Same Title
Search results for Design for AT-Speed Test, Diagnosis and Measurement:...
Stock Image
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Seller: HPB-Red, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Seller Inventory # S_396544618
Stock Image
Design for at-Speed Test, Diagnosis and Measurement
Seller: Better World Books, Mishawaka, IN, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages. Seller Inventory # 45935109-6
Stock Image
Design for at-Speed Test, Diagnosis and Measurement
Seller: Better World Books: West, Reno, NV, U.S.A.
Seller rating 5 out of 5 stars
Condition: Fine. Used book that is in almost brand-new condition. Seller Inventory # 52308925-75
Stock Image
Design for At-Speed Test, Diagnosis and Measurement
Seller: ThriftBooks-Dallas, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less. Seller Inventory # G0792386698I4N00
Seller Image
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Seller: Bay State Book Company, North Smithfield, RI, U.S.A.
Seller rating 5 out of 5 stars
Condition: good. The book is in good condition with all pages and cover intact, including the dust jacket if originally issued. The spine may show light wear. Pages may contain some notes or highlighting, and there might be a "From the library of" label. Boxed set packaging, shrink wrap, or included media like CDs may be missing. Seller Inventory # BSM.S817
Seller Image
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 4 out of 5 stars
Condition: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear. Seller Inventory # GWSVV.0792386698.G
Seller Image
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 4 out of 5 stars
Condition: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact. Seller Inventory # GWSVV.0792386698.A
Stock Image
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
Seller: SatelliteBooks, Burlington, VT, U.S.A.
Seller rating 4 out of 5 stars
Hardcover. Condition: As New. Hardcover, no DJ as issued Free of any markings and no writing. Minor shelf-wear. For Additional Information or pictures, Please Inquire. Seller Inventory # SKU002982
Stock Image
1990 HC Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Seller: Miki Store, San Jose, CA, U.S.A.
Seller rating 5 out of 5 stars
hardcover. Condition: Very Good. Pages are crisp and clean, no marking. Cover is verygood. Binding is tight/good. Seller Inventory # xc-bs36
Stock Image
Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Seller: Toscana Books, AUSTIN, TX, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks. Seller Inventory # Scanned0792386698