Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications: Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.: Vol 1155

Butterbaugh, J. (Editor)/ Demkov, a (Editor)/ Harris, R. (Editor)/ Rachmady, W. (Editor)/ Taylor, B. (Editor)

ISBN 10: 1605111287 ISBN 13: 9781605111285
Published by Materials Research Society, 2009
Language: English
Condition: New Hardcover

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