Cmos Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications

Rachmady Willy Butterbaugh Jeffery W. Harris H. Rusty Taylor Bill Demkov Alexander A.

ISBN 10: 1605111287 ISBN 13: 9781605111285
Published by Materials Research Society, 2009
Language: English
Condition: New Hardcover

Sold by Biblios, Frankfurt am main, HESSE, Germany

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