CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
Pavlov, Andrei; Sachdev, Manoj
ISBN 10: 1402083629 ISBN 13: 9781402083624
Published by Springer, 2008
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About this Item
Description:
This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Series: Frontiers in Electronic Testing. Num Pages: 210 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 239 x 166 x 19. Weight in Grams: 468. . 2008. 2008th Edition. hardcover. . . . . Seller Inventory # V9781402083624
Synopsis:
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.
About the Author: Prof. Sachdev has authored several successful books with Springer
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Bibliographic Details
Title: CMOS SRAM Circuit Design and Parametric Test...
Publisher: Springer
Publication Date: 2008
Binding: Hardcover
Condition: New
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Hardcover)
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Springer-Verlag New York Inc., New York, NY, 2008
ISBN 10: 1402083629
ISBN 13: 9781402083624
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Hardcover. Condition: new. Hardcover. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Seller Inventory # 9781402083624
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