Advanced Materials Characterization Techniques

Language: English

Published by LAP LAMBERT Academic Publishing Okt 2022, 2022

6205501902 / 9786205501900

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -Advanced Materials Characterization Techniques: Material Characterization - Electronic & Optical Properties of the Nanomaterials of Computational Science describes how computational methods and tools function to assist in resolving issues in nanoscale technology and science. The book focuses on the development of electron beam epitaxy, molecular beam epitaxy, fine line lithography, and other experimental techniques, low dimensional quantum effect devices with quantum confinements in one, two, and three dimensions of the wave vector space, such as quantum wells, metal oxide semiconductor field effect transistors, quantum wires, and quantum dots, magnetic quantization, magneto quantum size effects, magnetic inversion layers, superlattices, and field effect transistors. The electron transport in semiconductor devices is essentially determined by their respective band structures. Thus, the nature of the electronic properties become different in the aforementioned systems and varies with the magnitude of the quantizing magnetic field, the quantizing electric field and other types of quantum confined structures. 692 pp. Englisch.

Seller Inventory # 9786205501900

Title
Advanced Materials Characterization Techniques
Author
Subhamoy Singha Roy
Publisher
LAP LAMBERT Academic Publishing Okt 2022
Publication year
2022
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
6205501902
ISBN 13
9786205501900
Item weight
1,048 grams
Dimensions
220x150x42 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

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BuchWeltWeit Ludwig Meier e.K.

Germany