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Advanced Materials Characterization Techniques: Material characterization – Electronic & Optical properties - Softcover
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Advanced Materials Characterization Techniques: Material Characterization - Electronic & Optical Properties of the Nanomaterials of Computational Science describes how computational methods and tools function to assist in resolving issues in nanoscale technology and science. The book focuses on the development of electron beam epitaxy, molecular beam epitaxy, fine line lithography, and other experimental techniques, low dimensional quantum effect devices with quantum confinements in one, two, and three dimensions of the wave vector space, such as quantum wells, metal oxide semiconductor field effect transistors, quantum wires, and quantum dots, magnetic quantization, magneto quantum size effects, magnetic inversion layers, superlattices, and field effect transistors. The electron transport in semiconductor devices is essentially determined by their respective band structures. Thus, the nature of the electronic properties become different in the aforementioned systems and varies with the magnitude of the quantizing magnetic field, the quantizing electric field and other types of quantum confined structures.
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Advanced Materials Characterization Techniques
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LAP LAMBERT Academic Publishing, 2022
ISBN 10: 6205501902
ISBN 13: 9786205501900
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Singha Roy Dr. SubhamoyDr. Subhamoy Singha RoyPh.D and Post doctoral work on Nanotechnology and Quantum Biophysics (ISI Kolkata and J.U Kolkata, India). At present, he is doing research from IACS, Kolkata. He is also working at the f. Seller Inventory # 753796770
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Advanced Materials Characterization Techniques
Published by
LAP LAMBERT Academic Publishing Okt 2022, 2022
ISBN 10: 6205501902
ISBN 13: 9786205501900
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Advanced Materials Characterization Techniques: Material Characterization - Electronic & Optical Properties of the Nanomaterials of Computational Science describes how computational methods and tools function to assist in resolving issues in nanoscale technology and science. The book focuses on the development of electron beam epitaxy, molecular beam epitaxy, fine line lithography, and other experimental techniques, low dimensional quantum effect devices with quantum confinements in one, two, and three dimensions of the wave vector space, such as quantum wells, metal oxide semiconductor field effect transistors, quantum wires, and quantum dots, magnetic quantization, magneto quantum size effects, magnetic inversion layers, superlattices, and field effect transistors. The electron transport in semiconductor devices is essentially determined by their respective band structures. Thus, the nature of the electronic properties become different in the aforementioned systems and varies with the magnitude of the quantizing magnetic field, the quantizing electric field and other types of quantum confined structures. 692 pp. Englisch. Seller Inventory # 9786205501900
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Advanced Materials Characterization Techniques | Material characterization - Electronic & Optical properties
Published by
LAP LAMBERT Academic Publishing, 2022
ISBN 10: 6205501902
ISBN 13: 9786205501900
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Taschenbuch
Seller: preigu, Osnabrück, Germany
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Taschenbuch. Condition: Neu. Advanced Materials Characterization Techniques | Material characterization - Electronic & Optical properties | Subhamoy Singha Roy | Taschenbuch | Englisch | 2022 | LAP LAMBERT Academic Publishing | EAN 9786205501900 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Seller Inventory # 125798667
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Advanced Materials Characterization Techniques
Published by
LAP LAMBERT Academic Publishing Okt 2022, 2022
ISBN 10: 6205501902
ISBN 13: 9786205501900
New
Taschenbuch
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Advanced Materials Characterization Techniques: Material Characterization - Electronic & Optical Properties of the Nanomaterials of Computational Science describes how computational methods and tools function to assist in resolving issues in nanoscale technology and science. The book focuses on the development of electron beam epitaxy, molecular beam epitaxy, fine line lithography, and other experimental techniques, low dimensional quantum effect devices with quantum confinements in one, two, and three dimensions of the wave vector space, such as quantum wells, metal oxide semiconductor field effect transistors, quantum wires, and quantum dots, magnetic quantization, magneto quantum size effects, magnetic inversion layers, superlattices, and field effect transistors. The electron transport in semiconductor devices is essentially determined by their respective band structures. Thus, the nature of the electronic properties become different in the aforementioned systems and varies with the magnitude of the quantizing magnetic field, the quantizing electric field and other types of quantum confined structures.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 692 pp. Englisch. Seller Inventory # 9786205501900
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Advanced Materials Characterization Techniques : Material characterization - Electronic & Optical properties
Published by
LAP LAMBERT Academic Publishing, 2022
ISBN 10: 6205501902
ISBN 13: 9786205501900
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Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Advanced Materials Characterization Techniques: Material Characterization - Electronic & Optical Properties of the Nanomaterials of Computational Science describes how computational methods and tools function to assist in resolving issues in nanoscale technology and science. The book focuses on the development of electron beam epitaxy, molecular beam epitaxy, fine line lithography, and other experimental techniques, low dimensional quantum effect devices with quantum confinements in one, two, and three dimensions of the wave vector space, such as quantum wells, metal oxide semiconductor field effect transistors, quantum wires, and quantum dots, magnetic quantization, magneto quantum size effects, magnetic inversion layers, superlattices, and field effect transistors. The electron transport in semiconductor devices is essentially determined by their respective band structures. Thus, the nature of the electronic properties become different in the aforementioned systems and varies with the magnitude of the quantizing magnetic field, the quantizing electric field and other types of quantum confined structures. Seller Inventory # 9786205501900
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Advanced Materials Characterization Techniques: Material characterization Electronic & Optical properties
Published by
LAP LAMBERT Academic Publishing, 2022
ISBN 10: 6205501902
ISBN 13: 9786205501900
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paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book. Seller Inventory # ERICA82362055019026