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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science, 711) - Softcover
Book 199 of 578: Communications in Computer and Information Science
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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
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VLSI Design and Test (eng)
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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science, 711)
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VLSI Design and Test
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. 840 pp. Englisch. Seller Inventory # 9789811074691
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VLSI Design and Test
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Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and . Seller Inventory # 178843978
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VLSI Design and Test | 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
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Taschenbuch. Condition: Neu. VLSI Design and Test | 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers | Brajesh Kumar Kaushik (u. a.) | Taschenbuch | xxi | Englisch | 2017 | Springer | EAN 9789811074691 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. Seller Inventory # 111011620
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VLSI Design and Test
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 840 pp. Englisch. Seller Inventory # 9789811074691
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Vlsi Design and Test: 21st International Symposium, Vdat 2017, Roorkee, India, June 29-july 2, 2017, Revised Selected Papers
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VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. Seller Inventory # 9789811074691
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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science, 711)
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