Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication.
"synopsis" may belong to another edition of this title.
Seller: Amnesty Bookshop, Malvern, Great Malvern, United Kingdom
Hb without Dj. Condition: Fine. First Edition. Contains nearly all the papers presented at the Symposium on "Defects and Qualities of Semiconductors" held in Tokyo in May 1984. In immaculate condition throughout. All profits to Amnesty International. Size: 15.5cm - 23.3cm with 261pp. Seller Inventory # 011399
Quantity: 1 available