Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits, 2nd ED - Softcover
Book 18 of 40: Frontiers in Electronic Testing
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Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits
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Soft cover. Condition: New. ISBN:9788184894295,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition. Seller Inventory # 2438289
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DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
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New Age International Publisher, 2010
ISBN 10: 8184894295
ISBN 13: 9788184894295
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Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide. Seller Inventory # ABNR-9155
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DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Published by
New Age International Publisher, 2010
ISBN 10: 8184894295
ISBN 13: 9788184894295
New
Softcover
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Condition: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability. Seller Inventory # ASNT3-9155
International Edition
DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
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Paperback. Condition: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability. Seller Inventory # AD 9788184894295