Ultrafast Phenomena V: Proceedings of the Fifth OSA Topical Meeting Snowmass, Colorado, June 16–19, 1986: 46 (Springer Series in Chemical Physics, 46) - Softcover

Softcover

ISBN 10: 3642829201 ISBN 13: 9783642829208

Publisher: Springer, 2014

Synopsis

The first Optical Society of America (OSA) Topical Meeting on Picosec­ ond Phenomena, held at Hilton Head, South Carolina, in 1978, brought together in a congenial setting an interdisciplinary group of laser engineers and physicists who were exploring the emerging technologies for generat­ ing and applying picosecond optical pulses, together with scientists from the fields of chemistry, physics, biology, and electronics who saw in those pulses capabilities for studying atomic and molecular phenomena on time scales previously unrealizable. The technology in this field has since developed even more rapidly and remarkably than foreseen eight years ago, and the applications to science and technology, in physics, chemistry, biology, electronics, and commu­ nications, have proven to be equally extraordinary. Optical pulses with pulse widths shorter than 10 femtosecond - only a few optical cycles in du­ ration - along with mono cycle infrared pulses, complex nonlinear optical solitons, electrooptic techniques with subpicosecond time resolutions, and a full toolkit of measurement and detection techniques have now emerged, including new methods for making ultrafast measurements in some cases even without ultrafast optical pulses. These tools are now being widely applied to study the internal motions of complex molecules and atomic lat­ tices, the relaxation times of superheated electrons in solids, the ultrafast dynamics of chemical reactions, the excited-state lifetimes of photosyn­ thetic and visual pigments, and the response times of the fastest electronic circuits yet developed.

Edition details

• Publisher: Springer
• Publication date: 2014
• Language: English
• ISBN 10: 3642829201
• ISBN 13: 9783642829208
• Binding: Paperback
• Number of pages: 574
• Editor: Fleming Graham R., Siegman Anthony E.